Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11749830 | System and method for manufacturing secondary battery | — | 2023-09-05 |
| 7644447 | Scanning probe microscope capable of measuring samples having overhang structure | Sang-Il Park, Yong Seok Kim, Jitae Kim, Sang Han Chung, Jung-Rok Lee +1 more | 2010-01-05 |
| 7514679 | Scanning probe microscope for measuring angle and method of measuring a sample using the same | Young-Doo Kim, Yong Seok Kim, Sang-Il Park | 2009-04-07 |