Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7145595 | Image processing and inspection system | Masayuki Hattori, Jun Nishijima, Osamu Iijima, Yoshinori Koizumi | 2006-12-05 |
| 6920180 | Image processing inspection apparatus | Kazutaka Ikeda, Kazuo Sawada, Yoshimasa Fujiwara | 2005-07-19 |
| 5875004 | Image processing inspection apparatus | Hisato Taniwaki, Yoshimasa Fujiwara, Masayuki Hattori, Takayoshi Akiyama | 1999-02-23 |
| 5351126 | Optical measurement system for determination of an object's profile or thickness | Yuji Takada, Hiroshi Matsuda, Yoshihiko Sugimoto | 1994-09-27 |