Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7765446 | Method for testing semiconductor integrated circuit and method for verifying design rules | — | 2010-07-27 |
| 7543206 | Method for testing semiconductor integrated circuit and method for verifying design rules | — | 2009-06-02 |
| 7498967 | Semiconductor device | Masaya Hirose, Kinya Daio, Tetsuya Oosaka | 2009-03-03 |