Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11965735 | Thickness measurement method, thickness measurement device, defect detection method, and defect detection device | Yousuke Irie, Hirotsugu Inoue | 2024-04-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11965735 | Thickness measurement method, thickness measurement device, defect detection method, and defect detection device | Yousuke Irie, Hirotsugu Inoue | 2024-04-23 |