Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7719301 | Testing method of semiconductor integrated circuit and information recording medium | Akihiro Maejima, Jinsaku Kaneda, Eisaku Maeda | 2010-05-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7719301 | Testing method of semiconductor integrated circuit and information recording medium | Akihiro Maejima, Jinsaku Kaneda, Eisaku Maeda | 2010-05-18 |