HK

Hind Kraytem

PT Palantir Technologies: 9 patents #192 of 1,331Top 15%
Overall (All Time): #543,017 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11892901 Data analysis system to facilitate investigative process David Skiff, Allen Cai, Benjamin Lee, Christopher Yu, Jason Ma +3 more 2024-02-06
11789931 User-interactive defect analysis for root cause Jason Ma, Allen Cai, Andrew Cooper, Arnaud Drizard, Benjamin Lee +9 more 2023-10-17
11755454 Defect resolution Arnaud Drizard, Christopher McFarland, Jean Caillé, Ludovic Lay 2023-09-12
11645250 Detection and enrichment of missing data or metadata for large data sets Arnaud Drizard, Ludovic Lay, Jean Caillé 2023-05-09
11341027 Defect resolution Arnaud Drizard, Christopher McFarland, Jean Caillé, Ludovic Lay 2022-05-24
11314721 User-interactive defect analysis for root cause Jason Ma, Allen Cai, Andrew Cooper, Arnaud Drizard, Benjamin Lee +9 more 2022-04-26
11126489 Data analysis system to facilitate investigative process David Skiff, Allen Cai, Benjamin Lee, Christopher Yu, Jason Ma +3 more 2021-09-21
10360252 Detection and enrichment of missing data or metadata for large data sets Arnaud Drizard, Ludovic Lay, Jean Caillé 2019-07-23
10133621 Data analysis system to facilitate investigative process David Skiff, Allen Cai, Benjamin Lee, Christopher Yu, Jason Ma +3 more 2018-11-20