RK

Riitta Kaijansaari

OO Oxford Instruments Analytical Oy: 1 patents #11 of 24Top 50%
📍 Helsinki, FI: #2,126 of 3,940 inventorsTop 55%
Overall (All Time): #3,420,579 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7065174 Measurement arrangement for X-ray fluoresence analysis Heikki Johannes Sipilä 2006-06-20