KK

Kai Kuparinen

OO Oxford Instruments Analytical Oy: 1 patents #11 of 24Top 50%
📍 Siuntio, FI: #8 of 13 inventorsTop 65%
Overall (All Time): #3,388,746 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7233643 Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy Heikki Johannes Sipilä, Tero Eklin 2007-06-19