Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7833792 | Test strip measuring method | Masaaki Mori, Masao Ninomiya, Eiji Ikegami, Akira Tanaka | 2010-11-16 |
| 5239365 | Method of measuring thickness of liquid crystal cells | — | 1993-08-24 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7833792 | Test strip measuring method | Masaaki Mori, Masao Ninomiya, Eiji Ikegami, Akira Tanaka | 2010-11-16 |
| 5239365 | Method of measuring thickness of liquid crystal cells | — | 1993-08-24 |