Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6946864 | Method for measuring product parameters of components formed on a wafer and device for performing the method | Wolfgang Gramann, Raimund Oberschmid, Werner Spath | 2005-09-20 |
| 5999552 | Radiation emitter component | Georg Bogner, Herbert Brunner, Heinz Haas, Johann Luft, Ernst Nirschl +2 more | 1999-12-07 |