Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7088120 | Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure | Takuya Matsumoto, Yasuhisa Naitoh, Tomoji Kawai | 2006-08-08 |