Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10429287 | Interferometric method for measuring a size of particle in the presence of a gap | Makoto Kawano, Hitoshi Watarai | 2019-10-01 |
| 10261050 | Method for measuring characteristics of a particle and device for measuring characteristics of a particle | Makoto Kawano, Hitoshi Watarai | 2019-04-16 |