Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4850710 | Method of measuring and displaying double refraction occurring in a material to be measured | Yoshihiro Mochida, Takeyuki Sugimoto, Naoshi Kiyomoto | 1989-07-25 |
| 4673294 | Film thickness measuring apparatus employing microprojector of spectral reflection measurement | Yoshihiro Mochida, Nobuo Adachi | 1987-06-16 |
| 4666305 | Film thickness measuring apparatus employing intensity compensation device of spectral reflectivity | Yoshihiro Mochida | 1987-05-19 |