Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7010734 | Method for microprocessor test insertion reduction | Donald E. Fox | 2006-03-07 |
| 5878050 | Method and apparatus for data compare detection of memory errors on a computers memory subsystem | Keith E. Thompson, Raymond E. Keefer, Van Lam | 1999-03-02 |
| 5175495 | Detection of semiconductor failures by photoemission and electron beam testing | Sudhakar R. Gouravaram, Ramin Halaviati | 1992-12-29 |