Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6457150 | Method and apparatus for on-chip monitoring of integrated circuits with a distributed system | — | 2002-09-24 |
| 5920765 | IC wafer-probe testable flip-chip architecture | David Bassett | 1999-07-06 |