Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8037447 | Identifying semiconductor system specification violations | — | 2011-10-11 |
| 7844926 | Specification window violation identification with application in semiconductor device design | — | 2010-11-30 |
| 7716023 | Multidimensional process corner derivation using surrogate based simultaneous yield analysis | Aaron Barker | 2010-05-11 |
| 6687648 | Method of predicting reliabilty of oxide-nitride-oxide based non-volatile memory | Santosh Kumar | 2004-02-03 |