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Meny Shy

OM Optimet, Optical Metrology: 1 patents #6 of 13Top 50%
📍 Aminadav, IL: #3 of 4 inventorsTop 75%
Overall (All Time): #3,516,868 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6590654 Polarized illumination and detection for metrological applications Gabriel Y. Sirat, Yaacov Zerem, Valery Deich 2003-07-08