Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8717578 | Profilometer, measuring apparatus, and observing apparatus | Yasuhiro Ohnishi, Masaki Suwa, Shree K. Nayar | 2014-05-06 |
| 8411979 | Digital image processing and enhancing system and method with function of removing noise | Yuming Zhao, Jiapeng Liu, Yanfeng Xiao, Feng Shen, Masaki Suwa | 2013-04-02 |
| 5910817 | Object observing method and device | Katsumi Ohashi | 1999-06-08 |