Issued Patents All Time
Showing 25 most recent of 64 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12038385 | Examination method, system, and computer-readable medium | — | 2024-07-16 |
| 11982617 | Observation apparatus, optical deflection unit, and image formation method | Takashi Miyoshi | 2024-05-14 |
| 11815672 | Observation device | — | 2023-11-14 |
| 11635364 | Observation device | — | 2023-04-25 |
| 11460682 | Observation device | — | 2022-10-04 |
| 11163143 | Observation apparatus | — | 2021-11-02 |
| 11150456 | Observation apparatus | — | 2021-10-19 |
| 11016279 | Observation device | Masaki Higurashi | 2021-05-25 |
| 10914931 | Observation device | Shintaro Takahashi | 2021-02-09 |
| 10877256 | Observation device | Shintaro Takahashi | 2020-12-29 |
| 10838186 | Information acquisition apparatus | Kento Hara, Yasuharu Yamada | 2020-11-17 |
| 10670849 | Observation device | — | 2020-06-02 |
| 10501718 | Observation apparatus | Akira Matsushita, Shintaro Takahashi, Masaru MIZUNAKA, Shinichi Takimoto, Yohei TANIKAWA | 2019-12-10 |
| 10437050 | Phase-modulation-element adjustment system and method for decreasing wavefront aberration | — | 2019-10-08 |
| 10281704 | Observation apparatus and observation method to observe a sample with reflected light transmitted through the sample | Shintaro Takahashi, Yasunobu IGA, Shinichi Takimoto, Takashi Miyoshi | 2019-05-07 |
| 10016119 | Objective optical system | Takeshi Watanabe | 2018-07-10 |
| 8717672 | Variable-focus optical system | — | 2014-05-06 |
| 8711473 | Focus adjustment unit and optical scanning microscope | — | 2014-04-29 |
| 8405903 | Objective-optical-system positioning apparatus and examination apparatus | Masahiro Oba | 2013-03-26 |
| 8169724 | Objective lens adapter | Hiroya Fukuyama | 2012-05-01 |
| 7907335 | Focus-adjusting unit and microscope | — | 2011-03-15 |
| 7801589 | In-vivo examination method and in-vivo examination apparatus | Yoshihisa Tanikawa, Yasuaki Natori, Chika Nakajima, Yoshihiro Kawano | 2010-09-21 |
| 7782528 | Microscope examination apparatus | Hiroya Fukuyama, Yoshihisa Tanikawa, Seiya Takahashi | 2010-08-24 |
| 7699477 | Alignment method, alignment apparatus, and alignment screen for objective-lens guiding device | — | 2010-04-20 |
| 7643208 | Optical scanning observation apparatus | — | 2010-01-05 |