Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12279752 | Inspection analysis method and inspection analysis system | — | 2025-04-22 |
| 10743015 | Endoscope apparatus and imaging method | — | 2020-08-11 |
| 9195045 | Endoscope apparatus having first and second light sources and control section which controls the first light and second light sources according to a detected type of attached adapter | — | 2015-11-24 |
| 7850598 | Endoscope apparatus for performing measurement using image | Eiichi Kobayashi | 2010-12-14 |