Issued Patents All Time
Showing 1–25 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12247330 | Cylindrical structure | Takafumi Inoue, Masayuki Tsuji, Eiji Taguchi, Ryosuke EBINA | 2025-03-11 |
| 11291373 | Deep-body-temperature estimation system, heat stress warning system, and deep-body-temperature estimation method | Tasuku KIMURA, Ryo Yasumitsu, Hiroshi Nose, Yu Ogawa | 2022-04-05 |
| 9957611 | Removal device for semiconductor manufacturing apparatus and semiconductor manufacturing apparatus | — | 2018-05-01 |
| 9617650 | Cationic electrodeposition coating composition and coated article | Eisaku Okada, Kouji Takezoe | 2017-04-11 |
| 9543596 | Seal member for fuel cell and fuel cell seal body using same | Kenji Yamamoto, Kaoru Yasui, Shinji Kita | 2017-01-10 |
| 8414753 | Method for forming coating film | Eisaku Okada, Minoru Hanatani | 2013-04-09 |
| 8159033 | ESD protection device and manufacturing method thereof | — | 2012-04-17 |
| 7859063 | Semiconductor device using SOI-substrate | — | 2010-12-28 |
| 7729096 | Semiconductor integrated circuit | — | 2010-06-01 |
| 7723794 | Load driving device | Toshikazu Kuroda, Yasuhiro Fukuda | 2010-05-25 |
| 7671415 | Electro-static discharge protection circuit and semiconductor device having the same | Toshikazu Kuroda, Yasuhiro Fukuda | 2010-03-02 |
| 7521713 | Semiconductor device having electrostatic discharge element | — | 2009-04-21 |
| 7498615 | Electro-static discharge protection circuit and semiconductor device having the same | Toshikazu Kuroda, Yasuhiro Fukuda | 2009-03-03 |
| RE40597 | Evaluation TEG for semiconductor device and method of evaluation | — | 2008-12-02 |
| 7434179 | Design and simulation methods for electrostatic protection circuits | — | 2008-10-07 |
| 7302378 | Electrostatic discharge protection device modeling method and electrostatic discharge simulation method | — | 2007-11-27 |
| 7268003 | Method of evaluating semiconductor device | — | 2007-09-11 |
| 7197439 | Method for modeling semiconductor device process | — | 2007-03-27 |
| 7000201 | Evaluation TEG for semiconductor device and method of evaluation | — | 2006-02-14 |
| 6981236 | Method for modeling semiconductor device and network | — | 2005-12-27 |
| 6594625 | Method for modeling diffusion of impurities in a semiconductor | — | 2003-07-15 |
| 6581028 | Profile extraction method and profile extraction apparatus | — | 2003-06-17 |
| 6566712 | SOI structure semiconductor device and a fabrication method thereof | Kouichi Fukuda, Noriyuki Miura | 2003-05-20 |
| 6277684 | Method of fabricating a SOI structure semiconductor device | Kouichi Fukuda, Noriyuki Miura | 2001-08-21 |
| 5452019 | Projected image displaying apparatus and a method of correcting color unevenness therein | Hidenori Fukuda | 1995-09-19 |