XJ

Xiankun Jin

NU Nxp Usa: 10 patents #147 of 2,066Top 8%
FS Freeescale Semiconductor: 3 patents #982 of 3,767Top 30%
NB Nxp B.V.: 3 patents #771 of 3,591Top 25%
🗺 Texas: #9,006 of 125,132 inventorsTop 8%
Overall (All Time): #288,647 of 4,157,543Top 7%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
11961577 Testing of on-chip analog-mixed signal circuits using on-chip memory Kumar Abhishek, Mark Lehmann 2024-04-16
11728336 Compensated alternating polarity capacitive structures Robert S. Jones 2023-08-15
11585849 Apparatuses involving calibration of input offset voltage and signal delay of circuits and methods thereof Tao Chen, Jan-Peter Schat 2023-02-21
11561255 Systems and methods for detecting faults in an analog input/output circuitry Kumar Abhishek, Srikanth Jagannathan 2023-01-24
11489535 Analog-to-digital converter (ADC) testing Douglas A. Garrity, Mark Lehmann, Kumar Abhishek 2022-11-01
11418188 Bootstrapped switch Kushagra Bhatheja, Chris C. Dao 2022-08-16
10866277 Analog-test-bus apparatuses involving calibration of comparator circuits and methods thereof Jan-Peter Schat, Tao Chen 2020-12-15
10816595 Self-test apparatuses having distributed self-test controller circuits and controller circuitry to control self-test execution based on self-test properties and method thereof Jan-Peter Schat, Tao Chen, Lei Ma 2020-10-27
10770457 Compensated alternating polarity capacitive structures Robert S. Jones 2020-09-08
10505519 Dynamic comparator Tao Chen, Jan-Peter Schat 2019-12-10
10474553 Built-in self test for A/D converter Mark J Stachew 2019-11-12
10359469 Non-intrusive on-chip analog test/trim/calibrate subsystem Douglas A. Garrity 2019-07-23
10345841 Current source with variable resistor circuit Robert S. Jones 2019-07-09
9473164 Method for testing analog-to-digital converter and system therefor Tao Chen 2016-10-18
9438262 Method for testing differential analog-to-digital converter and system therefor Tao Chen, Douglas A. Garrity 2016-09-06
9319033 Ramp voltage generator and method for testing an analog-to-digital converter Douglas A. Garrity 2016-04-19