Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11587636 | Integrated circuit with embedded memory modules | Wenbin Yang | 2023-02-21 |
| 9805826 | Method and apparatus for testing integrated circuit | Wanggen Zhang | 2017-10-31 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11587636 | Integrated circuit with embedded memory modules | Wenbin Yang | 2023-02-21 |
| 9805826 | Method and apparatus for testing integrated circuit | Wanggen Zhang | 2017-10-31 |