Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12164401 | Method and apparatus to inject errors in a memory block and validate diagnostic actions for memory built-in-self-test (MBIST) failures | Umesh Pratap Singh, Ajay Sharma, Ashish Goel | 2024-12-10 |
| 11222707 | Utilization of control fuses for functional operations in system-on-chips | Rohit Kumar Sinha, Tomasz Szuprycinski, Deepak Mahajan | 2022-01-11 |