Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7550990 | Method and apparatus for testing integrated circuits for susceptibility to latch-up | Paul Hendrik Cappon, Peter C. de Jong, Taede Smedes | 2009-06-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7550990 | Method and apparatus for testing integrated circuits for susceptibility to latch-up | Paul Hendrik Cappon, Peter C. de Jong, Taede Smedes | 2009-06-23 |