Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174238 | Intelligent wafer-level testing of photonic devices | Barak Freedman, Nizan Meitav, Santiago Echeverri, Jochem Verbist, Allan Green-Petersen | 2024-12-24 |
| 12135348 | Substrate testing with three-dimensional scanning | Barak Freedman | 2024-11-05 |
| 12135461 | Backside fiber attachment to silicon photonics chip | Barak Freedman, Henning Lysdal, Nizan Meitav | 2024-11-05 |