Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9664706 | Semiconductor chip testing apparatus for picking up and testing a semiconductor chip | Duk Soon Choi, In Seol HWANG, Seong Han Park, In-Seob Kwon, Dong Shin Kim | 2017-05-30 |
| 8975906 | Probe for inspecting electronic component | — | 2015-03-10 |