JR

Jeremy Rogers

Northwestern University: 6 patents #219 of 3,846Top 6%
NH Northshore University Healthsystem: 2 patents #14 of 27Top 55%
SS Siemens Industry Software: 1 patents #111 of 391Top 30%
SS Siemens Product Lifecycle Management Software: 1 patents #96 of 315Top 35%
WARF: 1 patents #1,912 of 4,123Top 50%
📍 Madison, WI: #541 of 4,527 inventorsTop 15%
🗺 Wisconsin: #5,297 of 40,088 inventorsTop 15%
Overall (All Time): #534,308 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Showing 1–9 of 9 patents

Patent #TitleCo-InventorsDate
12262986 Lesion volume measurements system Randall Joel Kimple, Junzhou Chen, Hunter Alexander Higby, Ryan Wisth, Kyuhyun Lee 2025-04-01
11392726 Variational modeling method and system for editing of geometric objects Michael John Gibbens, Douglas Joseph King, Howard Charles Duncan Mattson 2022-07-19
10684417 Probe apparatus for measuring depth-limited properties with low-coherence enhanced backscattering Vadim Backman, Nikhil N. Mutyal, Bradley Gould, Andrew J. Radosevich, The Quyen Nguyen 2020-06-16
10360312 System and method for identifying clones Howard Charles Duncan Mattson, Douglas Joseph King, Michael John Gibbens 2019-07-23
10229310 High throughput partial wave spectroscopic microscopy and associated systems and methods Vadim Backman, Hariharan Subramanian, John E. Chandler, Craig White, Lusik Cherkezyan 2019-03-12
9885834 Probe apparatus for measuring depth-limited properties with low-coherence enhanced backscattering Vadim Backman, Nikhil N. Mutyal, Bradley Gould, Andrew J. Radosevich 2018-02-06
9830501 High throughput partial wave spectroscopic microscopy and associated systems and methods Vadim Backman, Hariharan Subramanian, John E. Chandler, Craig White, Lusik Cherkezyan 2017-11-28
8131348 Systems, methods and apparatuses of elastic light scattering spectroscopy and low coherence enhanced backscattering spectroscopy Vadim Backman, Hemant Roy, Brand Randall, Yang Liu, Vladimir Turzhitsky 2012-03-06
7652772 Systems, methods, and apparatuses of low-coherence enhanced backscattering spectroscopy Vadim Backman, Hemant Roy, Young Kim, Yang Liu, Vladimir Turzhitsky 2010-01-26