Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12099017 | Inspection system, inspection method, and inspection program | Yatfei Chan | 2024-09-24 |
| 11410409 | Image classification system and method, classification data creation system and method, and storage medium | — | 2022-08-09 |
| 10891725 | Inspection apparatus and inspection method | — | 2021-01-12 |