Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4979394 | Non-destructive inspection method | Yakichi Higo, Toshio Takano, Junichiro Matsuoka, Tadashi Ashida | 1990-12-25 |
| 4819753 | Functional evaluation device capable of evaluating an artificial device by the use of acoustic emission | Yakichi Higo, Masashi Ono | 1989-04-11 |