Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8506159 | Method for detecting defect in material and system for the method | Junichi Nakagawa, Tadayuki Ito, Tetsuo Nishiyama, Masahiro Doki, Kozo Saito +7 more | 2013-08-13 |