Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8506159 | Method for detecting defect in material and system for the method | Junichi Nakagawa, Tadayuki Ito, Tetsuo Nishiyama, Masahiro Doki, Kozo Saito +7 more | 2013-08-13 |
| 8204294 | Systems and methods for detecting defects in coatings utilizing color-based thermal mismatch | Richard Alloo, Kozo Saito, Belal Gharaibeh, Nelson Akafuah, Ahmad Salaimeh | 2012-06-19 |