Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6708130 | Product quality information management system | Yasuo Yamazaki | 2004-03-16 |
| 5766976 | Method for detecting crystal defects in a silicon single crystal substrate | — | 1998-06-16 |