IH

Ian George Haig

NN Nikon Metrology Nv: 1 patents #17 of 42Top 45%
Overall (All Time): #1,904,134 of 4,157,543Top 50%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10614990 Target assembly for an x-ray emission apparatus and x-ray emission apparatus 2020-04-07
6885728 X-ray source Roger Hadland, Alan Copeland Crawley, Paul Justin Keanly 2005-04-26