DA

Diego Alfredo Punin Albarracin

NN Nikon Metrology Nv: 1 patents #17 of 42Top 45%
📍 Berkhamsted, GB: #30 of 56 inventorsTop 55%
Overall (All Time): #4,146,257 of 4,157,543Top 100%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10463339 Artefact for evaluating the performance of an X-ray computed tomography system Daniel E. Hilton 2019-11-05