| 12135336 |
Contact, inspection jig, inspection device, and method of manufacturing contact |
— |
2024-11-05 |
| 12055562 |
Contact terminal, inspection jig, and inspection apparatus |
Yusuke YOKOTA |
2024-08-06 |
| 12055561 |
Contact terminal, inspection jig, and inspection device |
— |
2024-08-06 |
| 12013416 |
Contact terminal, inspection jig, and inspection device |
Michio Kaida, Yusuke YOKOTA |
2024-06-18 |
| 11467186 |
Inspection jig, inspection device, and contact terminal |
Sukkwi Kim |
2022-10-11 |
| 11415599 |
Contact probe and electrical connection jig |
Masami Yamamoto, Shigeki Sakai |
2022-08-16 |
| 11327094 |
Inspection jig, and inspection device including the same |
— |
2022-05-10 |
| 10914758 |
Inspection jig provided with probe, substrate inspection device provided with same, and method for manufacturing inspection jig |
Hidekazu Yamazaki |
2021-02-09 |
| 10877069 |
Inspection jig, substrate inspection device, and method for manufacturing inspection jig |
— |
2020-12-29 |
| 10877085 |
Inspection jig and inspection device |
Toshihiko Kanai, Yusuke YOKOTA |
2020-12-29 |
| 10782317 |
Contact probe |
Masami Yamamoto, Shigeki Sakai |
2020-09-22 |
| 10656179 |
Contact terminal, inspection jig, and inspection device |
— |
2020-05-19 |
| 10649005 |
Contact terminal, inspection jig, and inspection device |
— |
2020-05-12 |
| 10649004 |
Contact terminal, inspection jig, and inspection apparatus |
— |
2020-05-12 |
| 9733299 |
Inspection jig |
Mitsunobu Tokimasa, Kosuke Hirobe, Kohei Tsumura |
2017-08-15 |
| 4595253 |
Parallel-to-serial conversion of optical data using acousto-optical diffraction |
Tsukasa Yamashita, Masaharu Matano, Kazuhiko Mori |
1986-06-17 |
| 4532632 |
Tunable semiconductor laser |
Tsukasa Yamashita, Kazuhiko Mori, Masaharu Matano |
1985-07-30 |
| 4491384 |
Optical switch device |
Tsukasa Yamashita, Masaharu Matano, Kazuhiko Mori |
1985-01-01 |