Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8695990 | Wafer flattening apparatus and method | Jakov Kogan, Marc Levesque, Alexandr Filenkov | 2014-04-15 |
| 8144968 | Method and apparatus for scanning substrates | — | 2012-03-27 |
| 7551272 | Method and an apparatus for simultaneous 2D and 3D optical inspection and acquisition of optical inspection data of an object | — | 2009-06-23 |
| 7535560 | Method and system for the inspection of integrated circuit devices having leads | — | 2009-05-19 |
| 7012631 | Absolute position determination for a CCD-based acquisition unit | — | 2006-03-14 |
| 6885400 | CCD imaging device and method for high speed profiling | — | 2005-04-26 |
| 6335757 | CCD imaging device for high speed profiling | — | 2002-01-01 |
| 5406372 | QFP lead quality inspection system and method | Michel Blanchard | 1995-04-11 |