Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5939278 | Automated histological specimen classification system and method | Mathilde E. Boon, Lanbrecht P. Kok, Akiva Rutenberg, Mark Rutenberg | 1999-08-17 |
| 5655029 | Device and method for facilitating inspection of a specimen | Mark Rutenberg, Robert Tjon-Fo-Sang, Leonid Strinkovsky, James C. Herriman | 1997-08-05 |
| 5544650 | Automated specimen classification system and method | Mathilde E. Boon, Lanbrecht P. Kok, Akiva Rutenberg, Mark Rutenberg | 1996-08-13 |