Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7069486 | Test circuit for logical integrated circuit and method for testing same | Ryouichirou Nagamine | 2006-06-27 |
| 6553557 | Inter-functional-block restriction high-speed extraction method and recording medium having stored thereon an inter-functional-block restriction high-speed extraction program | Sawako Kataoka | 2003-04-22 |