TS

Toshiyuki Syo

NE Nec: 6 patents #2,374 of 14,502Top 20%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
Overall (All Time): #687,787 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #TitleCo-InventorsDate
12405604 Fault prediction device and fault prediction method 2025-09-02
6484305 Impurity quantity transfer device enabling reduction in pseudo diffusion error generated at integral interpolation of impurity quantities and impurity interpolation method thereof 2002-11-19
6313648 Method for quantitating impurity concentration in a semiconductor device 2001-11-06
6178544 Simulation mesh generation method, apparatus, and program product 2001-01-23
6130542 Method for quantitating impurity concentration in a semiconductor device 2000-10-10
5963732 Method for simulating impurity diffusion in semiconductor with oxidation 1999-10-05
5880977 Mesh generation device and its method for generating meshes having a boundary protective layer 1999-03-09