TT

Toshihide Tsuboi

NE Nec: 6 patents #2,374 of 14,502Top 20%
NE Nec Electronics: 5 patents #112 of 1,789Top 7%
NC Nippon Electric Co.: 1 patents #251 of 792Top 35%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
Overall (All Time): #385,435 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
8539173 Memory device, memory system and microcontroller including memory device, and memory control device Hisao Harigai 2013-09-17
7710138 Semiconductor chip and semiconductor device including the same Shinichi Nakatsu, Hideo Isogai, Takehiro Masumoto, Kazuyuki Nishizawa, Kimiharu Etou 2010-05-04
7564255 Semiconductor integrated circuit for reducing number of contact pads to be probed in probe test Shinichi Nakatsu, Hideo Isogai, Takehiro Masumoto, Kazuyuki Nishizawa, Kimiharu Etou 2009-07-21
7557646 Semiconductor device with non-intersecting power and ground wiring patterns Shinichi Nakatsu, Hideo Isogai, Takehiro Masumoto, Kazuyuki Nishizawa, Kimiharu Etou 2009-07-07
7492036 Semiconductor chip and semiconductor device including the same Shinichi Nakatsu, Hideo Isogai, Takehiro Masumoto, Kazuyuki Nishizawa, Kimiharu Etou 2009-02-17
7463547 Micro computer and method of optimizing microcomputer Shinichi Nakatsu, Hideo Isogai, Takehiro Masumoto, Kazuyuki Nishizawa, Kimiharu Etou 2008-12-09
5883415 CMOS semiconductor device with improved layout of transistors near LCD drive terminals 1999-03-16
5760447 Semiconductor device having pull-up or pull-down resistance 1998-06-02
5432802 Information processing device having electrically erasable programmable read only memory with error check and correction circuit 1995-07-11
5414375 CMOS output circuit with open drain transistor 1995-05-09
5287469 Electrically erasable and programmable non-volatile memory (EEPROM), wherein write pulses can be interrupted by subsequently received read requests 1994-02-15
5086413 Non-volatile semiconductor memory device having an improved testing mode of operation and method of forming checkerwise test pattern in memory cell array Norio Funahashi 1992-02-04
4490830 Radio signal transmission system including a plurality of transmitters for transmitting a common signal Tomokazu Kai 1984-12-25