Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11005458 | Semiconductor integrated circuit adapted to scan testing, and method of designing the same | — | 2021-05-11 |
| 8281278 | System and method for supporting design of semiconductor integrated circuit including processing scan chains | — | 2012-10-02 |
| 6044214 | Fault simulation method operable at a high speed | Takashi Kimura, Takumi Kaite, Eiji Harada | 2000-03-28 |