RO

Ryuichi Okamura

NE Nec: 7 patents #2,006 of 14,502Top 15%
RE Renesas Electronics: 3 patents #1,322 of 4,529Top 30%
NE Nec Electronics: 2 patents #384 of 1,789Top 25%
TC Taiyo Yuden Co.: 2 patents #481 of 959Top 55%
Honda Motor Co.: 1 patents #12,035 of 21,052Top 60%
Overall (All Time): #320,015 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10862448 Piezoelectric thin film resonator, filter, and multiplexer Yoshiyuki Yagami, Yoshiaki Takaoka 2020-12-08
9716956 Piezoelectric thin film resonator and method of fabricating the same Hiroshi Kawakami, Hiroomi KANEKO, Shinji Taniguchi, Tsuyoshi Yokoyama 2017-07-25
8575721 Semiconductor device 2013-11-05
8546851 Semiconductor integrated circuit device Hiroshi Furuta, Takaaki Kobayashi, Hirofumi Azuhata, Tomoya MORITA, Toshifumi Takahashi 2013-10-01
8283753 Semiconductor device 2012-10-09
7602064 Semiconductor device having an inspection hole striding a boundary Masatoshi Watarai 2009-10-13
7420190 Length measurement pattern, semiconductor device, and method of manufacturing a semiconductor device 2008-09-02
6764310 Apparatus for simulating ride on vehicle Satoru Ichihashi, Masayoshi Kai, Kunikazu Negishi, Takeshi Masaki 2004-07-20
6353266 Semiconductor device having improved pad coupled to wiring on semiconductor substrate 2002-03-05
6175136 Method of forming CMOS device with improved lightly doped drain structure 2001-01-16
6163057 Field effect transistor with improved source/drain diffusion regions having an extremely small capacitance 2000-12-19
6111320 Semiconductor device having a barrier film for preventing penetration of moisture 2000-08-29
6011308 Semiconductor device having a barrier film formed to prevent the entry of moisture and method of manufacturing the same 2000-01-04
5990522 Field effect transistor with improved source/drain diffusion regions having an extremely small capacitance 1999-11-23
5801426 Field effect transistor with improved source/drain diffusion regions having an extremely small capacitance 1998-09-01