Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6377064 | IC device inspection apparatus | Kazuhiro Kawaguchi, Kazuya Tsujino, Yasuyuki Takata, Keisuke Yoshida | 2002-04-23 |
| 6262584 | IC device temperature control system and IC device inspection apparatus incorporating the same | Kazuhiro Kawaguchi | 2001-07-17 |