KT

Kunihiro Takeda

NE Nec: 2 patents #5,510 of 14,502Top 40%
Fujitsu Limited: 1 patents #14,843 of 24,456Top 65%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
Overall (All Time): #1,225,599 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
10380117 Event occurrence place estimation method, computer-readable recording medium storing event occurrence place estimation program, and event occurrence place estimation apparatus 2019-08-13
8405209 Semiconductor device with varying bump density regions and method of manufacturing the same 2013-03-26
6549868 Semiconductor device test system and test method 2003-04-15
5473259 Semiconductor device tester capable of simultaneously testing a plurality of integrated circuits at the same temperature 1995-12-05