Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11714106 | Test apparatus, test method and recording medium | — | 2023-08-01 |
| 8878561 | Screening method, screening device and program | — | 2014-11-04 |
| 8011011 | Method and apparatus for processing data | — | 2011-08-30 |
| 7970817 | Information processing device, information processing method, and control program | Tadashi Hagiuda, Masao Hayashi, Kentaro Saito, Yoichi Takaragi, Akio Ito | 2011-06-28 |
| 7483799 | Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor | — | 2009-01-27 |
| 6996489 | Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor | — | 2006-02-07 |
| 6973395 | Observation and/or failure inspection apparatus, method and program therefor | Yutaka Yoshizawa | 2005-12-06 |
| 6931336 | Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same | — | 2005-08-16 |
| 6766485 | Integrated circuit fault tester, integrated circuit fault test method and recording medium recorded with fault test control program | — | 2004-07-20 |
| 6704675 | Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same | — | 2004-03-09 |
| 6694274 | Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same | — | 2004-02-17 |
| 6684170 | Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same | — | 2004-01-27 |
| 6510289 | Image formation system, control method of image formation system, image formation apparatus and storage medium thereof | Yoshihide Terao, Tetsuya Yokoyama | 2003-01-21 |
| 6480011 | Screening of semiconductor integrated circuit devices | — | 2002-11-12 |
| 6351835 | High speed LSI spectral analysis testing apparatus and method | — | 2002-02-26 |
| 6205559 | Method and apparatus for diagnosing failure occurrence position | — | 2001-03-20 |
| 6058502 | Diagnostic system analyzing frequency spectrum of electric power for diagnosing integrated circuit, method and information storage medium storing computer program for the method | — | 2000-05-02 |
| 5949798 | Integrated circuit fault testing system based on power spectrum analysis of power supply current | — | 1999-09-07 |
| 5801540 | Electronic circuit tester and method of testing electronic circuit | — | 1998-09-01 |
| 5790565 | CMOS integrated circuit failure diagnosis apparatus and diagnostic method | — | 1998-08-04 |
| 5659244 | Electronic circuit tester and method of testing electronic circuit | — | 1997-08-19 |