Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7263679 | Semiconductor integrated circuit device with boundary scan test and design automation apparatus, boundary scan test method and program | Yoshihiro Ohara | 2007-08-28 |
| 6212492 | Apparatus and method for circuit simulation which accounts for parasitic elements | — | 2001-04-03 |