Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7284171 | Integrated circuit device | — | 2007-10-16 |
| 7131041 | Semiconductor integrated circuit device and device for testing same | — | 2006-10-31 |
| 6118296 | Semiconductor integrated logic circuit | — | 2000-09-12 |
| 6028443 | Test circuit for semiconductor integrated logic circuit using tristate buffers allowing control circuit for tristate to be tested | — | 2000-02-22 |
| 5726998 | Partial scan path test of a semiconductor logic circuit | — | 1998-03-10 |
| 5703884 | Scanning pass test circuit | — | 1997-12-30 |
| 5425034 | Semiconductor integrated logic circuit with internal circuit to be examined by scan path test method | — | 1995-06-13 |
| 5337321 | Scan path circuit with clock signal feedback, for skew avoidance | — | 1994-08-09 |
| 4942577 | Logic circuit system with latch circuits for reliable scan-path testing | — | 1990-07-17 |
| 4876704 | Logic integrated circuit for scan path system | — | 1989-10-24 |