HM

Hajime Matsuzawa

NE Nec: 8 patents #1,742 of 14,502Top 15%
Overall (All Time): #659,266 of 4,157,543Top 20%
8
Patents All Time

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDate
7386407 Semiconductor device test method using an evaluation LSI Yukihiko Tanikawa 2008-06-10
7295027 Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet 2007-11-13
6891386 Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet 2005-05-10
6515497 Air pump operated test fixture and method for testing a circuit board 2003-02-04
6472724 Electronic device structure capable of preventing malfunction caused by electromagnetic wave coming from outside Koetsu Tamura 2002-10-29
6343365 Large-scale integrated circuit and method for testing a board of same Hiroo Ito 2002-01-29
6310780 Surface mount assembly for electronic components Koetsu Tamura 2001-10-30
6047394 Circuit for easily testing a logic circuit having a number of input-output pins by scan path 2000-04-04