Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8390310 | Test system and test method of semiconductor integrated circuit | — | 2013-03-05 |
| 7589554 | I/O interface circuit of intergrated circuit | — | 2009-09-15 |
| 7382152 | I/O interface circuit of integrated circuit | — | 2008-06-03 |
| 7164439 | Flicker correction apparatus and flicker correction method, and recording medium storing flicker correction program | Takuji Yoshida, Katsuji Kimura, Noboru Kubo, Hiroyuki Okuhata, Toshiyuki Kaya +2 more | 2007-01-16 |